Main Features
1. Large LCD Chinese display
The instrument is equipped with a large screen (105mm×65mm) Chinese menu interface. The display is divided into left and right sections - the left side is the function menu area, and the right side displays relevant status information prompts. Each step is clearly presented, allowing operators to use the instrument without professional training. In a single operation, the microprocessor automatically completes the entire measurement process, making it an ideal dielectric loss measurement device.
2. Massive data storage
Calendar chip and large storage for time-sorted result saving, history review, and printing.
3. Advanced data management
Data exportable via USB. View and manage data on any PC with our software, generate reports.
4. Multiple test modes
Multiple test modes: int/ext HV, int/ext standard, normal/reverse/self-excitation. HV D/L (>10kV) with external standard and HV.
5. One-step CVT testing
Also tests fully sealed CVT C1 and C2 D/L and capacitance simultaneously, plus CVT ratio and voltage angle difference.
6. High-speed signal sampling
Inverter and sampling circuit digitally controlled, output voltage continuously adjustable.
7. Multi-layer protection, safe and reliable
Multiple protections: input fluctuation, output short, overvoltage, overcurrent, temperature. Ground detection prevents boost without proper grounding.
Working Principle
Under AC voltage, the dielectric material consumes a portion of electrical energy, which is converted into heat and causes losses. This energy loss is called dielectric loss. When AC voltage is applied to a dielectric, a phase angle difference Ψ exists between the voltage and current in the dielectric. The complementary angle δ of Ψ is called the dielectric loss angle, and the tangent of δ (tgδ) is called the dielectric loss tangent. The tgδ value is a parameter used to measure dielectric loss. The instrument measurement circuit includes a standard circuit (Cn) and a test circuit (Cx). The standard circuit consists of a built-in high-stability standard capacitor and measurement circuit, while the test circuit consists of the test object and measurement circuit. The measurement circuit is composed of sampling resistors, preamplifiers, and A/D converters. By measuring the amplitude and phase of the standard circuit current and test circuit current respectively, the microcontroller then uses digital real-time acquisition methods and vector calculations to determine the capacitance value and dielectric loss tangent of the test object.
Built-in anti-interference for accurate measurement under external E-field.
Note: The above information and technical parameters are compiled and published by Yangzhou Darui Electric Co., Ltd.
